Event Highlights

【Event Highlights】Critical Facilities User Meeting

On April 17th, RCCI successfully hosted the "Critical Facilities User Meeting," focusing on the synergy of core instrumentation. The session highlighted advanced tools including Atomic Force Microscopy (AFM), maskless lithography (u-MLA), and solar thin-film analysis systems. Beyond technical orientations, the meeting featured case studies and practical application insights. Participants not only understanding of equipment capabilities but also sparked cross-disciplinary collaborations, we aim to further refine our service quality and boost overall research excellence!